E01000 - SEMI E10 - Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) and Utilization Revision:SEMI E10-0221 - Superseded SEMI MF391-0310 (technical revision)

SEMI MF391-0310 (technical revision)

DWC) as perceived by a SEMI Equipment Communications Standard 2 (SECS-II) host that complies with the GEM model (as specified in § 13)

such as very fast bipolar switching devices and high power devices

orgで入手可能になり，2003年7月発行に至る。初版は1995年発行。

SEMI G18 — Specification for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes

E01000 - SEMI E10 - Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) and Utilization Revision:SEMI E10-0221 - Superseded SEMI MF391-0310 (technical revision)1 Purpose 1. 1 This Specification establishes a common basis for communication between users and suppliers of manufacturing equipment in the semiconductor and related industries by providing a standardized methodology for measuring reliability, availability, and maintainability (RAM) and utilization performance of equipment in a manufacturing environment. 2 Scope 2. 1 This Specification defines six mutually exclusive, basic equipment states for all of