MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials StdVol-Equipment Automation Software The notation is intended to

The notation is intended to be used when documenting the purpose

for instance wafers or sheets

本仕様は，プラスチックモールドS

org in June 2018

This Test Method may also be applied to any leadframe materials with thickness ≤0

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials StdVol-Equipment Automation Software The notation is intended toThe determination of conductivity type and the presence of junctions in semiconductors is important in processing or inspection of semiconducting materials for device fabrication as well as in research and development. This Test Method covers four procedures that are widely used for making routine measurements. This Test Method covers the determination of the conductivity type of extrinsic semiconductors. While explicit details are given for germanium