PV08800 - SEMI PV88 - Test Method for Determination of Hydrogen in Photovoltaic (PV) Polysilicon by Inert Gas Fusion Infrared Absorption Method Revision:SEMI PV88-1018 (Reapproved 0124) - Current SEMI MF671-0705 (technical revision)

SEMI MF671-0705 (technical revision)

Current industry standards do not specifically relate to semiconductor seal performance

and reporting

where at least one is a device wafer

本スタンダードは，水分抽出法を用いた，リードフレーム上のイオン汚染を測定する手順について述べている。この方法は（Na+，NH4+，K+，Cl-，NO3-，Br-，SO42-，PO43-）に対し感度を持つ。

PV08800 - SEMI PV88 - Test Method for Determination of Hydrogen in Photovoltaic (PV) Polysilicon by Inert Gas Fusion Infrared Absorption Method Revision:SEMI PV88-1018 (Reapproved 0124) - Current SEMI MF671-0705 (technical revision)The purpose of this Test Method is to standardize analytical protocols for the determination of hydrogen content in photovoltaic (PV) polysilicon which may affect the safety of casting process for polycrystalline silicon ingot and the quality of polysilicon ingot relating to the subsequent properties and performances of PV solar products. This will facilitate comparison of test results among worldwide laboratories used for monitoring or qualifying PV