G08300 - SEMI G83 - Specification for Bar Code Marking of Product Packages Revision:SEMI G83-0301 - Superseded 2 Although it was developed

2  Although it was developed primarily for use in calibration of SSISs to be used for detection of LLSs on polished silicon wafers with geometrical characteristics as specified in SEMI M1

SEMI E27-92 (first published)

Adapter plates are subsystems of the process equipment and will conform to many of the design practices employed by primary system equipment suppliers

This method focuses on improving the accuracy and repeatability of the measurement by standardizing the test conditions and reporting and by routine calibration of the measurement

The scope of this Document covers high purity zirconium tert-butoxide which is used in the semiconductor industry for the deposition of zirconium oxide based layers by atomic layer deposition or chemical vapor deposition

G08300 - SEMI G83 - Specification for Bar Code Marking of Product Packages Revision:SEMI G83-0301 - Superseded 2 Although it was developedThis Specification describes the area needed for adding bar codes, the bar code specifications, and the code notation format for direct and indirect material product packages (unit packs) for semiconductor packaging. The following are the goals of this Specification: Quality control using computers Prevention of mistakes created by human error Material control at the manufacturing site The following is not a goal of this Specification: Purchasing