PV09500 - SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance StdVol-Gases TSVを対象とする。

TSVを対象とする。

and optical characteristics of FPD polarizing films

For FOSBs used with 300 mm wafers

本スタンダードは，global Silicon Wafer Committeeで技術的に承認されている。現版は2010年4月30日，global Audits and Reviews Subcommitteeにて発行が承認された。2010年6月にwww

This format is designed to be both hardware- and software-independent

PV09500 - SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance StdVol-Gases TSVを対象とする。The purpose of this Document is to standardize a fast and accurate test method for determining metallized vias resistance of metal wrap through (MWT) solar cells. The vias are a must and key design for MWT cells. The metallization within vias plays an important role for the performance of MWT solar cells because the generated current collected by the front fingers will be transferred through the vias to the rear side of the cells. If vias