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M00900 - SEMI M9 - 鏡面単結晶ガリウムヒ素スライスの仕様 Revision:SEMI M9-0708 - Superseded Application of this test method

SKU: 90476060135
4.3

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Description

Application of this test method is expected to yield comparable data among POU purifiers and filters tested for the purposes of qualification for its installation

This Specification can be applied to single wafer equipment as well as batch equipment

with information on investment and capacity by region and by company

SEMI G16-83 (first published)

photovoltaic (PV)

M00900 - SEMI M9 - 鏡面単結晶ガリウムヒ素スライスの仕様 Revision:SEMI M9-0708 - Superseded Application of this test methodglobal Compound Semiconductor Materials Committee20101221global Audits and Reviews Subcommittee20112www. semiviews. org www. semi. org198620083 2 Subordinate Documents: SEMI M9. 1 96E (Reapproved 0308) Standard for Round 50. 8 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications SEMI M9. 2 96E (Reapproved 0308) Standard for Round 76. 2 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device

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