F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded Only requirements for some attributes

Only requirements for some attributes are specified in Tables 1 and 2

SEMI M38-1101 (technical revision)

completion

The design and acceptance criteria may be used for metal lid/preform assemblies used on all types of semiconductor packages

This Test Method covers measurement of the thickness of silicon wafers

F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded Only requirements for some attributesNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. 316L ASTM A276ASTM A240ASTM A269ASTM A632316L