HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current Non-Member $1095 $995

Non-Member $1095       $995

This Standard addresses the communications needs within the semiconductor manufacturing environment with respect to the processing of material in equipment

Defects induced by thermal processing of silicon wafers may adversely influence device performance and yield

SEMI S1 — Safety Guideline for Equipment Safety Labels

and test method of metal wrap through PV module assembly

HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current Non-Member $1095 $995Because there are various requirements and measurement methods for patterned sapphire substrate (PSS) in the LED industry, a standardized measurement method of PSS needs to be established so that customers and PSS suppliers can work together smoothly. It is necessary to establish a standardized measurement method of PSS so that PSS suppliers will be able to provide clear and consistent product information to customers. Provides a measurement method