Semiconductor Fabrication Worker Safety Part 2 StdTpc-Package Test Methods 1 — Mechanical Specification for

1 — Mechanical Specification for Boxes and Pods Used to Transport and Store 300mm Wafers

SEMI E39 — Specification for Object Services Standard (OSS)

SEMI MF84 —Test Method for Measuring Resistivity of Silicon Wafers with an In-Line Four-Point Probe

and Fe represent one ensemble of highly detrimental impurities with respect to contamination from human sources (Na)

Participants will become familiar with many of the codes governing hazardous waste management

Semiconductor Fabrication Worker Safety Part 2 StdTpc-Package Test Methods 1 — Mechanical Specification forCourse Description Each step of the semiconductor manufacturing process has its hazards. You must understand the hazards and what controls are in place to protect you. Take this course to find out about some of the specific steps, their hazards, and safety measures. Ideal learners are semiconductor fabrication workers. Course Objectives Recognize semiconductor manufacturing processes and associated hazards and controls. Course Duration 31 minutes