D06200 - SEMI D62 - Test Method for Measurement of LED Light Bar for Liquid Crystal Displays Revision:SEMI D62-0619 (Reapproved 1224) - Current Reticle pod transfer between AMHS

Reticle pod transfer between AMHS vehicles and production equipment

although the actual wafer diameter and/or thickness may differ due to 3D stacking requirements and/or the effects of prior processing steps

system) that interact with the equipment

The guide includes the following items:

Inlet impurities must be measured by part-per-million (ppm) or part-per-billion (ppb) analytical equipment

D06200 - SEMI D62 - Test Method for Measurement of LED Light Bar for Liquid Crystal Displays Revision:SEMI D62-0619 (Reapproved 1224) - Current Reticle pod transfer between AMHS1 Purpose 1. 1 This Standard defines measurement methods and reporting requirements for various characteristics of light emitting diode (LED) light bar for liquid crystal displays (LCDs). This Standard will be helpful to unify methodologies measurement used for electro optical and mechanical characteristics which can be used to improve the quality of integrated LED backlight units and track conformity to original design rules. 2 Scope 2. 1 This