G08500 - SEMI G85 - マップデータ・フォーマット用仕様 StdPbc-0419 This Practice is not directly

This Practice is not directly applicable to evaluating wafer-to-wafer or lot-to-lot variations

some guidelines also address general design goals for effective human-machine performance

본 안전 가이드라인은 위험 에너지

This Test Method is applicable to specimens ranging in size from 5 mm in diameter to as large as the supporting components can accommodate

SEMI MF2139-1103 (first SEMI publication)

G08500 - SEMI G85 - マップデータ・フォーマット用仕様 StdPbc-0419 This Practice is not directlyNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Global Automated Test Equipment CommitteeNorth American Automated Test Equipment Committee20033122003411North American Regional Standards Committee20035www. semi. org2003720011120033 Referenced SEMI Standards SEMI G81 Specification