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G04300 - SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法 Revision:SEMI G43-87 (Reapproved 0811) - Superseded SEMI E68-0997 (Reapproved 0913)

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Description

SEMI E68-0997 (Reapproved 0913)

such as appearance

To apply the formulae in this Practice

SEMI E83-0413 (technical revision)

2  SIMS can measure the boron contamination in heavily-doped n-type substrates

G04300 - SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法 Revision:SEMI G43-87 (Reapproved 0811) - Superseded SEMI E68-0997 (Reapproved 0913)global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org19861987 : Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip

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