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SEMI E120-0922 (Reapproved 0823)
This Practice covers procedures for defining a wafer coordinate system for locating uniquely any point on a wafer surface using the wafer center as the origin and either Cartesian (x-y) or polar (r-θ) coordinates
org in June 2013
and other components as a measure of the effectiveness of passivation
which have discriminated between XLSs and LLSs for several years
G07100 - SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様 Revision:SEMI G71-0996 (Reapproved 0811) - Superseded SEMI E120-0922 (Reapproved 0823)global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1996200411 : Referenced SEMI Standards None.
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