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constructed
These defects have distinct effects on essential semiconductor device-manufacturing processes such as alloying and diffusion
緊急應變（第9節）
The purpose of this Document is to standardize requirements for phosphoric etchants used in the semiconductor industry and testing procedures to support those standards
SEMI G21 — Specification for Plating Integrated Circuit Leadframes
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Revision:SEMI PV50-0114 (Reapproved 1220) - Current constructedThis Specification is intended for the quality and the testing method of polyethylene (PE) bags. The quality of PE bags is critical as poor quality PE bags may contaminate polysilicon and cause contamination during transportation. Forming an industry consensus standard will minimize contamination, control the associated costs and improve communication between supplier and user. This Standard will cover the quality criteria and the associated test
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