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This Specification includes descriptions of the characteristics of the code formats to be employed
If this method is to be used for higher flow rate devices
it is used to ascertain the bond strength once the wafers are bonded
Therefore it is mandatory to operate system under tight statistical process control (SPC)
Transmission degradation should include reporting the number and intensity of the laser beam exposures
E14500 - SEMI E145 - Classification for Measurement Unit Symbols in XML Revision:SEMI E145-0414 - Superseded This Specification includes descriptions ofThe inclusion of extensible markup language (XML) notation within current SEMI Standards reflects the industrys growing interest in XML technology. This Standard defines the measurement units symbol representations in XML for the semiconductor industry based on units defined in SEMI E5, SEMI E6, and the International System of Units (SI). Its purpose is to provide a standardized set of symbols that represent common units for the semiconductor industry
