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E12900 - SEMI E129 - 半導体製造設備における静電気放電(ESD)の評価と制御へのガイド StdPbc-0914 1 This Specification may be

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Description

1  This Specification may be applied to equipment that is compliant to SEMI E30 (GEM)

This Document provides a guide to the test method to evaluate filter elements used in UPW fluid streams

SEMI E100 — Specification for a Reticle SMIF pod (RSP) to Transport and Store 6 Inch or 230mm Reticles

This guide was technically approved by the global Flat Panel Display Committee and is the direct responsibility of the North American Flat Panel Display Committee

1  This Guide applies to equipment constructed for the purpose of manufacturing semiconductor devices

E12900 - SEMI E129 - 半導体製造設備における静電気放電(ESD)の評価と制御へのガイド StdPbc-0914 1 This Specification may beglobal Metrics Technical Committee2012830global Audits and Reviews Subcommittee20129www. semiviews. org www. semi. org20031120097 SEMI E78 ESD electrostatic dischargeESDEMI electromagnetic interference ESA electrostatic attraction COO cost of ownershipSEMI E35 International Technology Roadmap for Semiconductors(ITRS) SEMI E78 ESD ESD SEMI E78SEMI E43 1 12. 71SEMI E129SEMI E78 EMIESDESD SEMI E78 67 Referenced SEMI Standards SEMI E33 Specification for

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