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and many other substrates are being made thinner such as lithium tantalate
it is necessary to standardize the test method for measuring optical properties of electronic paper displays
inspection and measurement used in backlight unit industry as well as panel and instrument industry
3-0698 (first published)
and repair this equipment
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors StdTpc-Equipment Models and many other substrates areThe purpose of this Test Method is to specify methods for the contactless measurement of the resistivity of semi insulating samples and wafers. This Test Method covers the determination of the electrical resistivity of semi insulating semiconductors, including GaAs, InP, CdTe, Cd(Zn)Te, SiC, GaN, and AlN, within the resistivity range 1E5 to 1E12 cm. It may also be used to characterize other materials exhibiting resistivity in this range, including in
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