3D01400 - SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products StdTpc-Substrate Carriers and Pods Different representative filters from the

Different representative filters from the same group of filters are tested during filter life time in order to confirm the frequency of the filter change out

6-0710 (Reapproved 0815)

but not exclusively

This edition was approved for publication by the global Audits and Reviews Subcommittee on April 15

inspection

3D01400 - SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products StdTpc-Substrate Carriers and Pods Different representative filters from theTo ensure consistent yield control of 3DS IC products, common criteria for incoming quality control (IQC) and outgoing quality control (OQC) of outsourced subassembly and test (OSAT) are needed. The generic testing flows for different 3DS IC products defined in this Guide will expedite the progress of 3DS IC testing. This Guide will define the criteria for IQC and OQC of OSATs, such as appearance, discoloration, missing ball or crack to clarify the