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1 The scope of this Standard is one grade of acetic acid used in the semiconductor industry
Semiconductor devices are currently being designed with smaller linewidths (<65 nm) and are therefore more susceptible to low level impurities
The constraints of the second procedure must be checked before applying it
SEMI M6-1108 (technical revision)
It also provides for standardized communication with lithography
G06200 - SEMI G62 - 銀めっきの試験方法 StdPbc-0703 1 The scope of thisglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
