G05600 - SEMI G56 - Test Method for Measurement of Silver Plating Thickness StdPbc-0723 SEMI E98 — Provisional Standard

SEMI E98 — Provisional Standard for the Object-Based Equipment Model (OBEM)

注意: 　本文書は，編集上の修正を伴い，再承認された。

005 Ω·cm

This Document describes a test method designed to draw comparisons of particulate generation performance of POU purifiers and filters tested under standard conditions

SEMI E99-0623 (technical revision)

G05600 - SEMI G56 - Test Method for Measurement of Silver Plating Thickness StdPbc-0723 SEMI E98 — Provisional Standard1 Purpose 1. 1 Use This Test Method may be used for process control and outgoing inspection at the supplier or by the customer for incoming inspection. 1. 2 Units This Test Method uses SI units. 2 Scope 2. 1 This Test Method describes the standard method for measuring the thickness of silver plating on semiconductor leadframes. Referenced SEMI Standards (purchase separately) None. Revision History SEMI G56 0318 (technical revision) SEMI G56 93